Technical Overview
The 2N7000 is an industry-standard small-signal N-channel enhancement-mode field-effect transistor produced by onsemi (datasheet NDS7002A/D, Rev. 11, March 2025). Fabricated using proprietary high cell density DMOS technology, the bulk 2N7000 is housed in a through-hole TO-92 package (CASE 135AN) with an S-G-D pinout (Pin 1 Source, Pin 2 Gate, Pin 3 Drain). Absolute maximum ratings at TC = 25°C specify a drain-source voltage of 60V, continuous drain-gate voltage of 60V (RGS <= 1 MΩ), continuous gate-source voltage of ±20V (non-repetitive peak ±40V for tp < 50 ms), continuous drain current of 200mA, pulsed drain current of 500mA, and total device dissipation of 400mW (derating 3.2 mW/°C above 25°C; RthetaJA = 312.5°C/W). Electrical characteristics guarantee minimum drain-source breakdown voltage BVDSS = 60V tested at VGS = 0V, ID = 10 µA. Gate threshold voltage VGS(th) spans 0.8V min, 2.1V typ, to 3.0V max at VDS = VGS, ID = 1.0 mA, representing the onset of channel conduction rather than low on-resistance enhancement. Static on-resistance RDS(on) is specified at 1.2 Ω typ, 5.0 Ω max at VGS = 10V, ID = 500 mA, and 1.8 Ω typ, 5.3 Ω max at VGS = 4.5V, ID = 75 mA. Switching times ton and toff are guaranteed at <= 10 ns max under specified test circuit conditions (VDD = 15V, RL = 25 Ω, ID = 500 mA, VGS = 10V, RGEN = 25 Ω). Input capacitance Ciss is 20 pF typ, 50 pF max at VDS = 25V, VGS = 0V, f = 1.0 MHz. Onsemi publishes no guaranteed body diode forward voltage or reverse recovery rows for the 2N7000 variant.